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Some aspects of IC reliability estimation through accelerated life tests

✍ Scribed by N. Boychinova; V. Filev; O. Mirchev

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 217 KB
Volume: 31
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(91)90303-o

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