Solution-processed low leakage organic field-effect transistors with self-pattern registration based on patterned dielectric barrier

✍ Scribed by Chang-Min Keum; Jin-Hyuk Bae; Min-Hoi Kim; Wonsuk Choi; Sin-Doo Lee

• Book ID: 113834474
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 899 KB
• Volume: 13
• Category: Article
• ISSN: 1566-1199
• DOI: 10.1016/j.orgel.2012.02.003