Solid State Amorphisation in Magnetic Multilayers: the Interface Structure and the Electrical Transport Properties

✍ Scribed by T. Stobiecki; M. Kopcewicz; F.J. Castaño

• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 609 KB
• Volume: 10
• Category: Article
• ISSN: 0960-0779
• DOI: 10.1016/s0960-0779(98)00252-5

✦ Synopsis

The structure and electrical conductivity properties of the R[F[ sputtered Fe:Zr and Fe:Ti multilayers with ultrathin layer thicknesses\ in as!deposited states\ have been studied using X!ray di}raction\ low!angle X!ray and neutron re~ectometry\ conversion electron Mo à ssbauer spectroscopy "CEMS#\ resis! tivity and magnetoresistivity measurements[ The thickness ratio "b d Fe :d Zr and d Fe :d Ti # of analysed multi! layers was 9[4 and 0\ the values of the bilayer thickness "l d Fe ¦d Ti\Zr # was varied from 8 A Ä to 599 A Ä \ maintaining constant the total thickness of the samples by controlling the number of bilayers[ The results obtained from CEM!spectroscopy and X!ray di}raction show that Fe layers of the thickness below 19 A Ä are alloyed forming an amorphous phase during deposition[ This amorphous phase is distributed in the plane between the crystalline sublayers as well as in the grain boundaries according with the proposed model of the interpretation of the electrical conductivity as a function of the bilayer thickness "l#[ Þ 0888 Elsevier Science Ltd[ All rights reserved