✦ LIBER ✦
SOI n-MOSFET low-frequency noise measurements and modeling from room temperature up to 250°C
✍ Scribed by Dessard, V.; Iniguez, B.; Adriaensen, S.; Flandre, D.
- Book ID
- 114616782
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 406 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
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