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Software-reliability growth with a Weibull test-effort: a model and application : Shigeru Yamada, Jun Hishitani and Shunji Osaki. IEEE Transactions on Reliability, 42(1), 100 (1993)


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
104 KB
Volume
34
Category
Article
ISSN
0026-2714

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