Software reliability assessment for an exponential-S-shaped reliability growth phenomenon

✍ Scribed by Mitsuhiro Kimura; Shigeru Yamada; Shunji Osaki

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 500 KB
• Volume: 24
• Category: Article
• ISSN: 0898-1221
• DOI: 10.1016/0898-1221(92)90230-f

✦ Synopsis

Many software reliability growth models based upon an NHPP (nonhomogeneous Poisson process) have been proposed to measure and assess the reliability of a software system quantitatively. Generally, the error-detection rate per residual error during software testing is considered to be dependent on the elapsed time of testing. In this paper, to describe such a software reliability growth aspect realistically, we classify the software errors detected by the testing into two classes: some are easy to be detected and corrected and the other difficult to be detected. We describe the errordetection phenomena of two cl~es of errors as the disslmilar NHPP's. Then, we propose exponential-S-shaped software reliability growth models by superposing the reliability growth proceases for the two error-detection phenomena. Finally, numerical illustrations of software rellability as~-ssment are shown by applying the actual error data, and the model proposed here is compared among the existing software reliability growth models in terms of goodness-of-fit.