Software reliability analysis based on a nonhomogeneous error detection rate model : Shigeru Yamada, Hiroyuki Narihisa and Hiroshi Ohtera. Microelectron. Reliab. 24 (5) 915 (1984)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 135 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90542-1