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life tests MASAAKI ISAGAWA, tlIDEO ONIYAMA and HIDEO AZEGAMI IEEE/ Proc. IRPS 52 (1981) The "memory retention life and its repeatability was examined under conditions of high temperature storage, temperature cycling, bias operating, and high humidity, and after write/erase cycles for MNMoOS EAROMs having short memory retention life. It is shown that the high temperature storage and humidity tests are representative of all these tests, retention life during humidity tests for PEDs is generally shorter than the unrecoverable failure life, and SiN overcoating extends retention life remarkably.
Application of step stress to time dependent breakdown
IEEEIProc. IRPS 23 (1981) A method if speeding up testing by step stressing is described. The mathematical models utilised, the theoretical and experimental results, and application to final failure rate estimates are shown.
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