Software image alignment for X-ray microtomography with submicrometre resolution using a SEM-based X-ray microscope

✍ Scribed by S. MAYO; P. MILLER; D. GAO; J. SHEFFIELD-PARKER

• Book ID: 108864405
• Publisher: John Wiley and Sons
• Year: 2007
• Tongue: English
• Weight: 288 KB
• Volume: 228
• Category: Article
• ISSN: 0022-2720
• DOI: 10.1111/j.1365-2818.2007.01857.x