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Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals

✍ Scribed by Joel A. Kelly; Eric J. Henderson; Colin M. Hessel; Ronald G. Cavell; Jonathan G.C. Veinot

Book ID: 108224624
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 452 KB
Volume: 268
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2009.09.040

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