Soft x-ray resonant magnetic reflectivity study of thin films and multilayers

✍ Scribed by Tonnerre, J. M.; Sève, L.; Barbara-Dechelette, A.; Bartolomé, F.; Raoux, D.; Chakarian, V.; Kao, C. C.; Fischer, H.; Andrieu, S.; Fruchart, O.

• Book ID: 119956183
• Publisher: American Institute of Physics
• Year: 1998
• Tongue: English
• Weight: 319 KB
• Volume: 83
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.367837