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Soft X-ray induced damage in PVA-based membranes in water environment monitored by X-ray absorption spectroscopy

✍ Scribed by Tzvetkov, George; Späth, Andreas; Fink, Rainer H.


Book ID
122200176
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
602 KB
Volume
103
Category
Article
ISSN
0969-806X

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## Abstract We carried out nondestructive measurements of the depth profile of etching‐induced damage in p‐type gallium nitride (p‐GaN), in particular surface band bending, using Hard X‐ray Photoelectron Spectroscopy (HAX‐PES). HAX‐PES at different take‐off angles of photoelectrons made it clear th