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Soft X-ray absorption spectroscopy and resonant inelastic X-ray scattering spectroscopy below 100 eV: probing first-row transition-metal M -edges in chemical complexes

✍ Scribed by Wang, Hongxin; Young, Anthony T.; Guo, Jinghua; Cramer, Stephen P.; Friedrich, Stephan; Braun, Artur; Gu, Weiwei


Book ID
120509630
Publisher
International Union of Crystallography
Year
2013
Tongue
English
Weight
612 KB
Volume
20
Category
Article
ISSN
0909-0495

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