✦ LIBER ✦
Soft-error filtering: a solution to the reliability problem of future VLSI digital circuits : Yvon Savaria, Nicholas C. Rumin, Jeremiah F. Hayes and Vinod K. Agarwal. Proc. IEEE74, 669 (1986)
- Book ID
- 103283365
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 235 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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