Soft Breakdown in Ultrathin SiO 2 Layers: the Conduction Problem from a New Point of View

✍ Scribed by Miranda, Enrique; Suñé, Jordi; Rodríguez, Rosana; Nafría, Montserrat; Martín, Ferran; Aymerich, Xavier

• Book ID: 127143532
• Publisher: Institute of Pure and Applied Physics
• Year: 1999
• Tongue: English
• Weight: 115 KB
• Volume: 38
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/jjap.38.2223