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Small-single-crystal diffractometry with monochromated synchrotron radiation – the wavelength-dispersion minimum condition for Bragg reflection profile measurement

✍ Scribed by McL Mathieson, A.


Book ID
114512946
Publisher
International Union of Crystallography
Year
1988
Tongue
English
Weight
613 KB
Volume
44
Category
Article
ISSN
0108-7673

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