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Small angle X-ray diffraction study of a-Si:H/a-Ge:H multilayers: reflectivity modeling and thermal stability

✍ Scribed by E.L Zeballos-Velásquez; M.C.A Fantini


Book ID
117148064
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
365 KB
Volume
209
Category
Article
ISSN
0022-3093

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