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Slow positron beam study of nitrogen implanted CZ-Si subjected to rapid thermal processing

✍ Scribed by X.P. Hao; R.S. Yu; B.Y. Wang; H.L. Chen; D.N. Wang; C.X. Ma; L. Wei


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
382 KB
Volume
253
Category
Article
ISSN
0169-4332

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