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Sizing of Atrial Septal Defects by Intracardiac Echocardiography for Device Closures

✍ Scribed by Jen-Chung Chien; Betau Hwang; Yun-Ching Fu; Pi-Chang Lee; Kai-Sheng Hsieh; Sheng-Ling Jan

No coin nor oath required. For personal study only.

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