Sizes of test sets for path delay faults using strong and weak non-robust tests

✍ Scribed by Pomeranz, I.; Reddy, S.M.

• Book ID: 117809927
• Publisher: The Institution of Engineering and Technology
• Year: 2011
• Tongue: English
• Weight: 130 KB
• Volume: 5
• Category: Article
• ISSN: 1751-8601
• DOI: 10.1049/iet-cdt.2010.0049