Size-Dependent-Transport Study of Gate-All-Around Nanowire MOSFETs: Impact of Quantum Confinement and Volume Inversion

✍ Scribed by Gu, J.J.; Heng Wu; Yiqun Liu; Neal, A.T.; Gordon, R.G.; Ye, P.D.

• Book ID: 119799731
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 420 KB
• Volume: 33
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2012.2194690