Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy

✍ Scribed by Stephanie N. Bogle; Lakshmi N. Nittala; Ray D. Twesten; Paul M. Voyles; John R. Abelson

• Book ID: 108291826
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 451 KB
• Volume: 110
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/j.ultramic.2010.05.001