✦ LIBER ✦
Si∕SiO[sub 2] Interface Oxidation Kinetics: A Physical Model for the Influence of High Substrate Doping Levels
✍ Scribed by Ho, C. P.
- Book ID
- 125941709
- Publisher
- The Electrochemical Society
- Year
- 1979
- Tongue
- English
- Weight
- 783 KB
- Volume
- 126
- Category
- Article
- ISSN
- 0013-4651
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