Si/SiGe valence band offset determination using photoluminescence and DLTS in SiGe quantum-well MOS capacitors

✍ Scribed by H Gamez-Cuatzin; A Daami; L Garchery; I Sagnes; Y Campidelli; G Brémond

• Book ID: 114155964
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 145 KB
• Volume: 43-44
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/s0167-9317(98)00242-1