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Singular value decomposition combined with wavelet transform for LCD defect detection

โœ Scribed by Wang, Jing-Wein; Chen, Wen-Yuan; Lee, Jiann-Shu


Book ID
121387555
Publisher
The Institution of Electrical Engineers
Year
2012
Tongue
English
Weight
104 KB
Volume
48
Category
Article
ISSN
0013-5194

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