Single-voltage-supply operation of Ga0.51In0.49P/AlGaAS/IN0.15Ga0.85As PHEMTS with high-power density
✍ Scribed by Hsing-Yuan Tu; Hsuan-Yu Pan; Shey-Shi Lu
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 87 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
✦ Synopsis
Comparison of BCP error with current and charge density distribution errors in the benchmark geometry has been carried out using the benchmark solutions and error metric for surface currents [8]. A correlation of BCP error with near-field electromagnetic characterization of the problem has been shown, and the advantages of the BCP error metric over other error metrics for the scatterer surface has been demonstrated.
BCP error criteria can be applied to properly refine the MoM problem geometry, to construct adaptive MoM schemes, to compare the efficiency of various MoM solutions, codes, basis and testing functions, as well as to develop new basis functions with necessary properties. Some of these applications will be presented in future work.
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