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Single-Variant and Multi-Variant Trend Tests for Genetic Association with Next-Generation Sequencing That Are Robust to Sequencing Error

✍ Scribed by Kim, Wonkuk; Londono, Douglas; Zhou, Lisheng; Xing, Jinchuan; Nato, Alejandro Q.; Musolf, Anthony; Matise, Tara C.; Finch, Stephen J.; Gordon, Derek


Book ID
120327777
Publisher
S. Karger AG
Year
2012
Tongue
English
Weight
758 KB
Volume
74
Category
Article
ISSN
0001-5652

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