Single ion impacts on an In0.22Ga0.78As/GaAs(100) surface observed by atomic force microscopy

✍ Scribed by I.H. Wilson; Y.J. Chen; J.B. Xu

• Book ID: 114169164
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 558 KB
• Volume: 124
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(97)00141-9