✦ LIBER ✦
Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
✍ Scribed by Koga, R.; Penzin, S.H.; Crawford, K.B.; Crain, W.R.; Moss, S.C.; Pinkerton, S.D.; LaLumondiere, S.D.; Maher, M.C.
- Book ID
- 115523360
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 850 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9499
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