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Single-Event Upset (SEU) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory (Block RAM) Within the Xilinx XQR5VFX130

✍ Scribed by Allen, Gregory R.; Edmonds, Larry; Tseng, Chen Wei; Swift, Gary; Carmichael, Carl


Book ID
118027533
Publisher
IEEE
Year
2010
Tongue
English
Weight
301 KB
Category
Article
ISSN
0018-9499

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