Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

✍ Scribed by Zoutendyk, J. A.; Smith, L. S.; Soli, G. A.; Thieberger, P.; Wegner, H. E.

• Book ID: 114663185
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 866 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1985.4334087