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Single-Event Transient Testing of Low Dropout PNP Series Linear Voltage Regulators

✍ Scribed by Allen, G. R.; Adell, P. C.; Dakai Chen, ; Musil, P.


Book ID
120061848
Publisher
IEEE
Year
2012
Tongue
English
Weight
1009 KB
Volume
59
Category
Article
ISSN
0018-9499

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