✦ LIBER ✦
Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination
✍ Scribed by Chumakov, A. I.; Vasil’ev, A. L.; Pechenkin, A. A.; Savchenkov, D. V.; Tararaksin, A. S.; Yanenko, A. V.
- Book ID
- 114991865
- Publisher
- Springer
- Year
- 2012
- Tongue
- English
- Weight
- 311 KB
- Volume
- 41
- Category
- Article
- ISSN
- 1063-7397
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