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Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination

✍ Scribed by Chumakov, A. I.; Vasil’ev, A. L.; Pechenkin, A. A.; Savchenkov, D. V.; Tararaksin, A. S.; Yanenko, A. V.


Book ID
114991865
Publisher
Springer
Year
2012
Tongue
English
Weight
311 KB
Volume
41
Category
Article
ISSN
1063-7397

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