Single-Event Damages Caused by Heavy Ions Observed in AlGaN/GaN HEMTs

✍ Scribed by Kuboyama, Satoshi; Maru, Akifumi; Shindou, Hiroyuki; Ikeda, Naomi; Hirao, Toshio; Abe, Hiroshi; Tamura, Takashi

• Book ID: 120032333
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 559 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2011.2171504