Simultaneous probing of phase transformations in Ni-Ti thin film shape memory alloy by synchrotron radiation-based X-ray diffraction and electrical resistivity

✍ Scribed by Braz Fernandes, F.M.; Mahesh, K.K.; Martins, R.M.S.; Silva, R.J.C.; Baehtz, C.; von Borany, J.

• Book ID: 120481869
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 453 KB
• Volume: 76
• Category: Article
• ISSN: 1044-5803
• DOI: 10.1016/j.matchar.2012.11.009