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Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes

✍ Scribed by H.Özgür Özer; Mehrdad Atabak; Recai M. Ellialtıoğlu; Ahmet Oral


Book ID
108417647
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
221 KB
Volume
188
Category
Article
ISSN
0169-4332

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