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Simultaneous measurements of electric and thermal fields utilizing an electrooptic semiconductor probe

✍ Scribed by Reano, R.M.; Kyoung Yang; Katehi, L.P.B.; Whitaker, J.F.


Book ID
114554231
Publisher
IEEE
Year
2001
Tongue
English
Weight
162 KB
Volume
49
Category
Article
ISSN
0018-9480

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