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Simultaneous measurement of the refractive index and thickness of thin films by S-polarized reflectances

✍ Scribed by Kihara, Tami ;Yokomori, Kiyoshi


Book ID
115342245
Publisher
The Optical Society
Year
1992
Tongue
English
Weight
694 KB
Volume
31
Category
Article
ISSN
1559-128X

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