Simultaneous magnetic force microscopy and magnetoresistance characterization of a magnetic tunnel junction with in situ applied field

✍ Scribed by Leib, J.S.; Baker, B.J.; Shen, Y.P.; Snyder, J.E.; Kawaguchi, T.; Jiles, D.C.

• Book ID: 125539147
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 604 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/TMAG.2003.816181