Simulation of X-ray diffraction line broadening caused by stress gradients and determination of surface stress distribution by Fourier analysis

✍ Scribed by Monin, V. I.; Assis, J. T.; Iglesias, S. M.

• Book ID: 121718698
• Publisher: International Union of Crystallography
• Year: 2012
• Tongue: English
• Weight: 76 KB
• Volume: 68
• Category: Article
• ISSN: 0108-7673
• DOI: 10.1107/s0108767312094858