Simulation of the recording process with a VSM on Co-Cr and Co-Ni-O layers deposited at oblique incidence

✍ Scribed by Bernards, J.P.C.; van Engelen, G.J.P.; Schrauwen, C.P.G.; Cramer, H.A.J.; Luitjens, S.B.

• Book ID: 114546762
• Publisher: IEEE
• Year: 1990
• Tongue: English
• Weight: 327 KB
• Volume: 26
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/20.104700