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Simulation of the electrical properties of polycrystalline ceramic semiconductors with submicrometer grain sizes

✍ Scribed by I. V. Rozhanskii; D. A. Zakheim

Book ID
110141942
Publisher
Springer
Year
2005
Tongue
English
Weight
194 KB
Volume
39
Category
Article
ISSN
1063-7826

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πŸ“œ SIMILAR VOLUMES

Influence of grain boundary recombinatio
Influence of grain boundary recombination velocity and grain size on the minority carrier lifetime in polycrystalline semiconductors
✍ C.A. Dimitriadis πŸ“‚ Article πŸ“… 1985 πŸ› Elsevier Science 🌐 English βš– 215 KB

The effective minority carrier lifetime in polycrystalline semiconductors is determined in terms of the grain size and the recombination velocity at the grain boundaries. The effect of the grain boundaries is to reduce the effective lifetime when the grain size is smaller than few diffusion lengths.