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Simulation of the creep damage behavior of thin film/substrate systems by bending creep tests

โœ Scribed by S.F. Wen; W.Z. Yan; J.X. Kang; J. Liu; Z.F. Yue


Publisher
Elsevier Science
Year
2010
Weight
967 KB
Volume
31
Category
Article
ISSN
0261-3069

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๐Ÿ“œ SIMILAR VOLUMES


Numerical Study of Creep Damage Behavior
โœ BX. Xu; J.S. Wan; B. Zhao; ZF. Yue ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 208 KB

A numerical study has been performed on the creep damage development of the thin film/substrate systems by the Kachanov-Rabothov damage law. The emphasis was to study the influence of the modulus ratio of the substrate to the thin film, the size of the indenter and the indentation stress. Results sh