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Simulation of stray-field coupling between stacked grain-oriented three-percent SiFe sheets concerning domain structure and stray-field profile
✍ Scribed by Schafer, H.; Mende, H.H.
- Book ID
- 114549060
- Publisher
- IEEE
- Year
- 1988
- Tongue
- English
- Weight
- 421 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0018-9464
- DOI
- 10.1109/20.43995
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