✦ LIBER ✦
Simulation of current fluctuations in submicron n-MOSFETs operating in the hot-carrier regime at RF frequencies using two-dimensional impedance field method
✍ Scribed by Contaret, Thierry; Varani, Luca; Vaissière, Jean-Claude
- Book ID
- 111883803
- Publisher
- Institute of Physics
- Year
- 2004
- Tongue
- English
- Weight
- 89 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0268-1242
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