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Simulation of correlated counts from an Am–Li source

✍ Scribed by Enrico Padovani; Paolo Peerani; Mirko Da Ros; Sara A. Pozzi


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
362 KB
Volume
557
Category
Article
ISSN
0168-9002

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✍ Olli P. M. Pekonen; Jie Xu; Keijo I. Nikoskinen 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 572 KB

FDTD simulations excited with a resistive voltage source are under study in this article. Focus is on the parasitic capacitance of the excitation. It is shown that the resistance of the excitation is actually a frequency-dependent impedance. Because the resistive voltage source operates as a current