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Simulation of capacitive array sensors using finite and infinite elements

✍ Scribed by P. R. Heyliger; J. C. Moulder; N. Nakagawa


Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
723 KB
Volume
2
Category
Article
ISSN
0894-3370

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✦ Synopsis


The response of capacitive array sensors in the presence of flawed solid materials is simulated using finite elements and infinite elements with exponential decay. Conventional finite elements are used to model the critical regions near the probe and the surface of the solid. Infinite elements are used to represent the farfield conditions of the space surrounding the probe and the solid. The method is first applied to problems with analytic solutions to determine the accuracy of the results obtained using the infinite elements. The response of a capacitive array sensor is then simulated using a line integral which measures the relative change in admittance between flawed and unflawed solids. Examples of capacitive probe responses are given for several parametric variations of the flaw size and dielectric constant of the solid.


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