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Simulation and two-dimensional analytical modeling of subthreshold slope in ultrathin-film SOI MOSFETs down to 0.1 μm gate length
✍ Scribed by Joachim, H.-O.; Yamaguchi, Y.; Ishikawa, K.; Inoue, Y.; Nishimura, T.
- Book ID
- 114535615
- Publisher
- IEEE
- Year
- 1993
- Tongue
- English
- Weight
- 678 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0018-9383
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