𝔖 Bobbio Scriptorium

✦ LIBER ✦

Simulation and Experimental Study on the Junction Termination Structure for High-Voltage 4H-SiC PiN Diodes

✍ Scribed by Hiyoshi, T.; Hori, T.; Suda, J.; Kimoto, T.

Book ID: 114619481
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 577 KB
Volume: 55
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2008.926643

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IC's (ISPSD) - San Diego, CA, USA

[IEEE IC's (ISPSD) - San Diego, CA, USA (2011.05.23-2011.05.26)] 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs - 5kV class 4H-SiC PiN diode with low voltage overshoot during forward recovery for high frequency inverter

✍ Ogata, S.; Miyanagi, Y.; Nakayama, K.; Tanaka, A.; Asano, K. 📂 Article 📅 2011 🏛 IEEE ⚖ 622 KB