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Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime

✍ Scribed by H.V. Nguyen; C. Salm; R. Wenzel; A.J. Mouthaan; F.G. Kuper


Book ID
108361928
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
806 KB
Volume
42
Category
Article
ISSN
0026-2714

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