Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime
β Scribed by H.V. Nguyen; C. Salm; R. Wenzel; A.J. Mouthaan; F.G. Kuper
- Book ID
- 108361928
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 806 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0026-2714
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